Shenzhen Chuangxin Instruments Co., Ltd
Shenzhen Chuangxin Instruments Co., Ltd
IEC61032 IP2X Probe Jointed Test Finger Probe B
  • IEC61032 IP2X Probe Jointed Test Finger Probe B
  • IEC61032 IP2X Probe Jointed Test Finger Probe B
  • IEC61032 IP2X Probe Jointed Test Finger Probe B
IEC61032 IP2X Probe Jointed Test Finger Probe B
IEC61032 IP2X Probe Jointed Test Finger Probe B
IEC61032 IP2X Probe Jointed Test Finger Probe B

IEC61032 IP2X Probe Jointed Test Finger Probe B

Payment Type:
T/T, Western Union
Incoterm:
FOB
Min. Order:
1 Piece/Pieces
Min. Order:
1 Piece/Pieces
Delivery Time:
4 Days
Transportation:
Ocean, Land, Air, express
Quantity:

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Basic Info
Basic Info
Place of Origin: China
Productivity: 10000/month
Supply Ability: 1000pcs/month
Payment Type: T/T,Western Union
Incoterm: FOB
Transportation: Ocean,Land,Air,express
Product Description
Product Description

IEC61032 IP2X Probe Jointed Test Finger Probe B


Key words: Test Probe B, Test Finger probe, Test probe, IP2X Probe, Jointed Finger Probe


This Jointed Test Finger Probe is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.


Conforms to:

This is the "international" IP2X test probe required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.


Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.


Technical Parameters:

Kunrled finger diameter 12mm
Knurled Finger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm

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