Green Card (Shenzhen) Co. Ltd
Green Card (Shenzhen) Co. Ltd
SIM Card with Working Frequency of 1 to 5MHz and High Performance IC
  • SIM Card with Working Frequency of 1 to 5MHz and High Performance IC
  • SIM Card with Working Frequency of 1 to 5MHz and High Performance IC
SIM Card with Working Frequency of 1 to 5MHz and High Performance IC
SIM Card with Working Frequency of 1 to 5MHz and High Performance IC

SIM Card with Working Frequency of 1 to 5MHz and High Performance IC

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Basic Info
Basic Info
Payment Type: Telegraphic Transfer (TT,T/T)
Product Description
Product Description
  • Material: ABS or PVC
  • CPU: 8 bits
  • Memorizer (32KB):
    • 256byte inner RAM (256 x 8 bits SRAM)
    • 1Kbyte outer RAM (1,024 x 8 bits SRAM)
    • 48Kbyte program memorizer (48KB x 8 bits ROM)
    • 32Kbyte data memorizer (32KB x 8 bits EEPROM)
  • EEPROM (32KB):
    • 32K EEPROM as data memorizer
    • Single byte read, write, and wipe
    • Multi-bytes storage (1 byte to 1 page)
    • Program clock come from vibrate clock that generated by chipitself
    • At the normal temperature, can proceed at least 100,000 timeserase and write operations
    • EEPROM data endurance more than ten years
    • EPROM program voltage generated in the chip
  • Serial I/O interface: match ISO/IEC-7816
  • Asynchronous half-duplex transmission protocol
  • Two kinds of transmission velocity (372/1 and 512/8)optional
  • Randomizer: 8 bits
  • Power on reset: internal power on reset mechanism
  • Low power work mode: sleep and clock stop
  • Safety mechanism: abnormal voltage/frequency detectionfunction, DPA/SPS attacking immunity
  • Working temperature: -25 to 70°C
  • Working voltage: 2.7V to 3.3V, 4.5V to 5.5V
  • Working frequency: 1 to 5MHz (3.57MHz)
  • Can be used in the agilent 8960 and others to test set whenrunning any GSM test or lab application
  • Several benefits:
    • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
    • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
    • For dual mode testing, GSM speech loopback is supported for GSMbit error ratio (BER) measurements
  • 256byte inner RAM (256 x 8 bits SRAM)
  • 1Kbyte outer RAM (1,024 x 8 bits SRAM)
  • 48Kbyte program memorizer (48KB x 8 bits ROM)
  • 32Kbyte data memorizer (32KB x 8 bits EEPROM)
  • 32K EEPROM as data memorizer
  • Single byte read, write, and wipe
  • Multi-bytes storage (1 byte to 1 page)
  • Program clock come from vibrate clock that generated by chipitself
  • At the normal temperature, can proceed at least 100,000 timeserase and write operations
  • EEPROM data endurance more than ten years
  • EPROM program voltage generated in the chip
  • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
  • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
  • For dual mode testing, GSM speech loopback is supported for GSMbit error ratio (BER) measurements
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