2.5GHz Test SIM Card, Made of ABS or PVC, with 256 Bytes Inner RAM and High Performance IC

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Basic Info

Payment Type:	Telegraphic Transfer in Advance (Advance TT, T/T)

Product Description

High performance IC

Used in smart card

Body material: ABS or PVC

CPU: 8 bits

Memorizer (32KB):

EEPROM (32KB):

Single byte read, write and wipe

Multi-bytes storage (1 byte to 1 page)

Program clock come from vibrate clock that generated by chipitself

At the normal temperature, can proceed at least 100,000 timeserase and write operations

EEPROM data endurance more than ten years

EEPROM program voltage generated in the chip

Serial I/O interface:

Randomizer: 8 bits

Power on reset: internal power on reset mechanism

Low power work mode: sleep and clock stop

Safety mechanism: abnormal voltage/frequency detection functionand DPA/SPS attacking immunity

Working temperature: -25 to 70°C

Working voltage: 2.7 to 3.3 and 4.5 to 5.5V

Working frequency: 1 to 5MHz (3.57MHz)

Can be used in the agilent 8960 and others to test set whenrunning any GSM test or lab application

Several benefits:

UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
For dual mode testing, GSM speech loopback is supported for GSMbit error ratio (BER) measurements

256 bytes inner RAM (256 x 8-bit SRAM)

1KB outer RAM (1,024 x 8-bit SRAM)

48KB program memorizer (48KB x 8-bit ROM)

32KB data memorizer (32KB x 8-bit EEPROM)

32KB EEPROM as data memorizer

Match IEC-7816

Asynchronous half-duplex transmission protocol

Two kinds of transmission velocity (372/1 and 512/8)optional

UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications

Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set

For dual mode testing, GSM speech loopback is supported for GSMbit error ratio (BER) measurements

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