Green Card (Shenzhen) Co. Ltd
Green Card (Shenzhen) Co. Ltd
GSM SIM Card, Made of ABS/PVC Material, 256 Bytes Inner RAM and High Performance IC
  • GSM SIM Card, Made of ABS/PVC Material, 256 Bytes Inner RAM and High Performance IC
GSM SIM Card, Made of ABS/PVC Material, 256 Bytes Inner RAM and High Performance IC

GSM SIM Card, Made of ABS/PVC Material, 256 Bytes Inner RAM and High Performance IC

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Basic Info
Basic Info
Payment Type: Telegraphic Transfer in Advance (Advance TT, T/T)
Product Description
Product Description
  • Specifications:
    • High performance IC
    • Used in smart card
    • Body materials: ABS or PVC
    • CPU: 8 bits
    • Memorizer (32KB):
      • 256 bytes inner RAM (256 x 8-bit SRAM)
      • 1KB outer RAM (1,024 x 8-bit SRAM)
      • 48KB program memorizer (48KB x 8-bit ROM)
      • 32KB data memorizer (32KB x 8-bit EEPROM)
    • EEPROM (32KB):
      • 32KB EEPROM as data memorizer
      • Single byte read, write and wipe
      • Multiple bytes storage (1 byte to 1 page)
      • Program clock come from vibrate clock that is generated by chipitself
      • At normal temperatures, can proceed at least 100,000 timeserase and write operations
      • Data endurance more than ten years
      • Program voltage generated in the chip
    • Serial I/O interfaces:
      • Match IEC-7816
      • Asynchronous half-duplex transmission protocol
      • Two kinds of transmission velocity (372/1 and 512/8)optional
      • Randomizer: 8 bits
      • Power on reset: internal mechanism
      • Low power work modes: sleep and clock stop
      • Safety mechanisms: abnormal voltage/frequency detectionfunction and DPA/SPS attacking immunity
    • Working temperatures: -25 to 70°C
    • Working voltages: 2.7 to 3.3 and 4.5 to 5.5V
    • Working frequencies: 1 to 5MHz (3.57MHz)
    • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab application
  • Benefits:
    • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
    • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
    • For dual mode testing, GSM speech loop-back is supported forGSM bit error ratio (BER) measurements
  • High performance IC
  • Used in smart card
  • Body materials: ABS or PVC
  • CPU: 8 bits
  • Memorizer (32KB):
    • 256 bytes inner RAM (256 x 8-bit SRAM)
    • 1KB outer RAM (1,024 x 8-bit SRAM)
    • 48KB program memorizer (48KB x 8-bit ROM)
    • 32KB data memorizer (32KB x 8-bit EEPROM)
  • EEPROM (32KB):
    • 32KB EEPROM as data memorizer
    • Single byte read, write and wipe
    • Multiple bytes storage (1 byte to 1 page)
    • Program clock come from vibrate clock that is generated by chipitself
    • At normal temperatures, can proceed at least 100,000 timeserase and write operations
    • Data endurance more than ten years
    • Program voltage generated in the chip
  • Serial I/O interfaces:
    • Match IEC-7816
    • Asynchronous half-duplex transmission protocol
    • Two kinds of transmission velocity (372/1 and 512/8)optional
    • Randomizer: 8 bits
    • Power on reset: internal mechanism
    • Low power work modes: sleep and clock stop
    • Safety mechanisms: abnormal voltage/frequency detectionfunction and DPA/SPS attacking immunity
  • Working temperatures: -25 to 70°C
  • Working voltages: 2.7 to 3.3 and 4.5 to 5.5V
  • Working frequencies: 1 to 5MHz (3.57MHz)
  • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab application
  • 256 bytes inner RAM (256 x 8-bit SRAM)
  • 1KB outer RAM (1,024 x 8-bit SRAM)
  • 48KB program memorizer (48KB x 8-bit ROM)
  • 32KB data memorizer (32KB x 8-bit EEPROM)
  • 32KB EEPROM as data memorizer
  • Single byte read, write and wipe
  • Multiple bytes storage (1 byte to 1 page)
  • Program clock come from vibrate clock that is generated by chipitself
  • At normal temperatures, can proceed at least 100,000 timeserase and write operations
  • Data endurance more than ten years
  • Program voltage generated in the chip
  • Match IEC-7816
  • Asynchronous half-duplex transmission protocol
  • Two kinds of transmission velocity (372/1 and 512/8)optional
  • Randomizer: 8 bits
  • Power on reset: internal mechanism
  • Low power work modes: sleep and clock stop
  • Safety mechanisms: abnormal voltage/frequency detectionfunction and DPA/SPS attacking immunity
  • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
  • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
  • For dual mode testing, GSM speech loop-back is supported forGSM bit error ratio (BER) measurements
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