Green Card (Shenzhen) Co. Ltd
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Green Card (Shenzhen) Co. Ltd
Test SIM Card, Made of ABS or PVC with 8-bit CPU
  • Test SIM Card, Made of ABS or PVC with 8-bit CPU
Test SIM Card, Made of ABS or PVC with 8-bit CPU

Test SIM Card, Made of ABS or PVC with 8-bit CPU

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Basic Info
Basic Info
Payment Type: Telegraphic Transfer in Advance (Advance TT, T/T)
Product Description
Product Description
  • High-performance IC
  • Used in smart card
  • Body materials: ABS or PVC
  • CPU: 8 bits
  • Memorizer (32KB):
    • 256 bytes inner RAM (256 x 8-bit SRAM)
    • 1kb outer RAM (1,024 x 8-bit SRAM)
    • 48kb program memorizer (48kb x 8-bit ROM)
    • 32kb data memorizer (32kb x 8-bit EEPROM)
  • EEPROM (32KB):
    • 32kb EEPROM as data memorizer
    • Single byte read, write, and wipe
    • Multiple bytes storage (1 byte to 1 page)
    • Program clock come from vibrate clock that generated by chipitself
    • At the normal temperature, can proceed at least 100,000 timeserase and write operations
    • EEPROM data endurance is more than ten years
    • EEPROM program voltage generated in the chip
  • Serial I/O interface:
    • Matches with ISO/IEC-7816
    • Asynchronous half-duplex transmission protocol
    • Two kinds of transmission velocity (372/1 and 512/8) areoptional
    • Randomizer: 8 bits
    • Power on reset: internal power on reset mechanism
    • Low-power working mode: sleep and clock stop
    • Safety mechanism: abnormal voltage/frequency detectionfunction, DPA/SPS attacking immunity
    • Working temperatures: -25 to 70°C
    • Working voltages: 2.7 to 3.3V, 4.5 to 5.5V
    • Working frequency: 1 to 5MHz (3.57MHz)
    • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab application
  • Several benefits:
    • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
    • Setup time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
    • For dual mode testing, GSM speech loopback is supported for GSMbit error ratio (BER) measurements
  • 256 bytes inner RAM (256 x 8-bit SRAM)
  • 1kb outer RAM (1,024 x 8-bit SRAM)
  • 48kb program memorizer (48kb x 8-bit ROM)
  • 32kb data memorizer (32kb x 8-bit EEPROM)
  • 32kb EEPROM as data memorizer
  • Single byte read, write, and wipe
  • Multiple bytes storage (1 byte to 1 page)
  • Program clock come from vibrate clock that generated by chipitself
  • At the normal temperature, can proceed at least 100,000 timeserase and write operations
  • EEPROM data endurance is more than ten years
  • EEPROM program voltage generated in the chip
  • Matches with ISO/IEC-7816
  • Asynchronous half-duplex transmission protocol
  • Two kinds of transmission velocity (372/1 and 512/8) areoptional
  • Randomizer: 8 bits
  • Power on reset: internal power on reset mechanism
  • Low-power working mode: sleep and clock stop
  • Safety mechanism: abnormal voltage/frequency detectionfunction, DPA/SPS attacking immunity
  • Working temperatures: -25 to 70°C
  • Working voltages: 2.7 to 3.3V, 4.5 to 5.5V
  • Working frequency: 1 to 5MHz (3.57MHz)
  • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab application
  • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
  • Setup time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
  • For dual mode testing, GSM speech loopback is supported for GSMbit error ratio (BER) measurements

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