Green Card (Shenzhen) Co. Ltd
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Green Card (Shenzhen) Co. Ltd
3G Test SIM Cards, Can be Used in Agilent 8960 and Others to Test Set
  • 3G Test SIM Cards, Can be Used in Agilent 8960 and Others to Test Set
3G Test SIM Cards, Can be Used in Agilent 8960 and Others to Test Set

3G Test SIM Cards, Can be Used in Agilent 8960 and Others to Test Set

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Basic Info
Basic Info
Payment Type: Telegraphic Transfer in Advance (Advance TT, T/T)
Product Description
Product Description
  • Specifications:
    • High performance IC
    • Used in smart cards
    • Body material: ABS or PVC
    • CPU: 8 bits
    • Memory (32KB):
      • 256 bytes inner RAM (256 x 8-bit SRAM)
      • 1KB outer RAM (1,024 x 8-bit SRAM)
      • 48KB program memory (48KB x 8-bit ROM)
      • 32KB data memory (32KB x 8-bit EEPROM)
    • EEPROM (32KB):
      • 32KB EEPROM as data memory
      • Single byte read, write and wipe
      • Multi-byte storage (1 byte to 1 page)
      • Program clock come from vibrate clock that generated by chipitself
      • At the normal temperature, can precede at least 100, 000 timeserase and write operating
      • EEPROM data endurance more than ten years
      • EEPROM program voltage generated in the chip
    • Serial I/O interface:
      • With IEC-7816 mark
      • Asynchronous half-duplex transmission protocol
      • Two kinds of transmission velocity (372/1 and 512/8)(optional)
    • Random: 8 bits
    • Power on reset: internal power on reset mechanism
    • Low-power working mode: sleep and clock stop
    • Safety mechanism: abnormal voltage, frequency detectionfunction and DPA/SPS attacking immunity
    • Operating temperatures: -25 to 70°C
    • Operating voltages: 2.7 to 3.3 and 4.5 to 5.5V
    • Operating frequency range: 1 to 5MHz (3.57MHz)
    • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab applications
  • Advantages:
    • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
    • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
    • For dual mode testing, GSM speech loop back is supported forGSM bit error ratio (BER) measurements
  • High performance IC
  • Used in smart cards
  • Body material: ABS or PVC
  • CPU: 8 bits
  • Memory (32KB):
    • 256 bytes inner RAM (256 x 8-bit SRAM)
    • 1KB outer RAM (1,024 x 8-bit SRAM)
    • 48KB program memory (48KB x 8-bit ROM)
    • 32KB data memory (32KB x 8-bit EEPROM)
  • EEPROM (32KB):
    • 32KB EEPROM as data memory
    • Single byte read, write and wipe
    • Multi-byte storage (1 byte to 1 page)
    • Program clock come from vibrate clock that generated by chipitself
    • At the normal temperature, can precede at least 100, 000 timeserase and write operating
    • EEPROM data endurance more than ten years
    • EEPROM program voltage generated in the chip
  • Serial I/O interface:
    • With IEC-7816 mark
    • Asynchronous half-duplex transmission protocol
    • Two kinds of transmission velocity (372/1 and 512/8)(optional)
  • Random: 8 bits
  • Power on reset: internal power on reset mechanism
  • Low-power working mode: sleep and clock stop
  • Safety mechanism: abnormal voltage, frequency detectionfunction and DPA/SPS attacking immunity
  • Operating temperatures: -25 to 70°C
  • Operating voltages: 2.7 to 3.3 and 4.5 to 5.5V
  • Operating frequency range: 1 to 5MHz (3.57MHz)
  • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab applications
  • 256 bytes inner RAM (256 x 8-bit SRAM)
  • 1KB outer RAM (1,024 x 8-bit SRAM)
  • 48KB program memory (48KB x 8-bit ROM)
  • 32KB data memory (32KB x 8-bit EEPROM)
  • 32KB EEPROM as data memory
  • Single byte read, write and wipe
  • Multi-byte storage (1 byte to 1 page)
  • Program clock come from vibrate clock that generated by chipitself
  • At the normal temperature, can precede at least 100, 000 timeserase and write operating
  • EEPROM data endurance more than ten years
  • EEPROM program voltage generated in the chip
  • With IEC-7816 mark
  • Asynchronous half-duplex transmission protocol
  • Two kinds of transmission velocity (372/1 and 512/8)(optional)
  • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
  • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
  • For dual mode testing, GSM speech loop back is supported forGSM bit error ratio (BER) measurements

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