CDMA Test SIM Card with Working Frequency of 1 to 5MHz and High-performance IC

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Basic Info

Payment Type:	Telegraphic Transfer in Advance (Advance TT, T/T)

Product Description

High-performance IC

Used in smart card

Body material: ABS or PVC

CPU: 8 bits

Memorizer (32K):EEPROM (32K)

Randomizer: 8 bits

Power on reset: internal power on reset mechanism

Low-power work mode: sleep and clock stop

Safety mechanism: abnormal voltage/frequency detection function, DPA/SPS attacking immunity

Working temperature: -25 to 70°C

Working voltage: 2.7V to 3.3V, 4.5V to 5.5V

Working frequency: 1 to 5MHz (3.57MHz)

Can be used in the agilent 8960 and others to test set when running any GSM test or lab application

256byte inner RAM (256 x 8 bits SRAM)1KB outer RAM (1,024 x 8 bits SRAM)48KB program memorizer (48K x 8 bits RM)32KB data memorizer (32K x 8 bits EEPROM)
32K EEPROM as data memorizer
Single byte read, write and wipe
Multi-bytes storage (1 byte to 1 page)
Program clock come from vibrate clock that generated by chip itself
At the normal temperature, can proceed at least 100,000 times erase and write operations
EEPROM data endurance more than ten years
EPROM program voltage generated in the chip
Asynchronous half-duplex transmission protocol Two kinds of transmission velocity (372/1 and 512/8) optional

Several benefits:

UMTS security variables within the SIM match the default settings of the GSM test and lab applications
Set-up time is reduced because the SIM is configured with the same default IMSI and PLMN values broadcast from the test set
For dual mode testing, GSM speech loopback is supported for GSM bit error ratio (BER) measurements

256byte inner RAM (256 x 8 bits SRAM)1KB outer RAM (1,024 x 8 bits SRAM)48KB program memorizer (48K x 8 bits RM)32KB data memorizer (32K x 8 bits EEPROM)

32K EEPROM as data memorizer

Single byte read, write and wipe

Multi-bytes storage (1 byte to 1 page)

Program clock come from vibrate clock that generated by chip itself

At the normal temperature, can proceed at least 100,000 times erase and write operations

EEPROM data endurance more than ten years

EPROM program voltage generated in the chip

Asynchronous half-duplex transmission protocol Two kinds of transmission velocity (372/1 and 512/8) optional

UMTS security variables within the SIM match the default settings of the GSM test and lab applications

Set-up time is reduced because the SIM is configured with the same default IMSI and PLMN values broadcast from the test set

For dual mode testing, GSM speech loopback is supported for GSM bit error ratio (BER) measurements

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