Green Card (Shenzhen) Co. Ltd
Green Card (Shenzhen) Co. Ltd
SIM Card, Provides Various Tests, Made of ABS or PVC Material
  • SIM Card, Provides Various Tests, Made of ABS or PVC Material
SIM Card, Provides Various Tests, Made of ABS or PVC Material

SIM Card, Provides Various Tests, Made of ABS or PVC Material

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Telegraphic Transfer in Advance (Advance TT, T/T)
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Basic Info
Basic Info
Payment Type: Telegraphic Transfer in Advance (Advance TT, T/T)
Product Description
Product Description
  • Features:
    • High performance IC
    • Used in smart card
    • Body material: ABS or PVC
    • CPU: 8 bits
    • 256 bytes inner RAM (256 x 8-bit SRAM)
    • 1KB outer RAM (1,024 x 8-bit SRAM)
    • 48KB program memorize (48KB x 8-bit ROM)
    • 32KB data memorize (32KB x 8-bit EEPROM)
    • 32KB EEPROM as data memorizer
    • Single byte read, write, and wipe
    • Multi-bytes storage (1 byte to 1 page)
    • Program clock come from vibrate clock that generated by chipitself
    • At the normal temperature, can precede at least 100,000-timeerase and write operating
    • EEPROM data endurance more than ten years
    • EEPROM program voltage generated in the chip
  • Serial I/O interface:
    • Asynchronous half-duplex transmission protocol
    • Two kinds of transmission velocity (372/1 and 512/8)(optional)
    • Randomizer: 8 bits
    • Power on reset: internal power on reset mechanism
    • Low-powered work mode: sleep and clock stop
    • Safety mechanism: abnormal voltage/frequency detectionfunction, DPA/SPS attacking immunity
    • Working temperature: -25 to +70 degrees Celsius
    • Working voltage: 2.7V to 3.3 and 4.5V to 5.5V
    • Working frequency: 1 to 5MHz (3.57MHz)
    • Can be used in the agilest 8960 and others to test set whenrunning any GSM test or lab application
  • Several benefits:
    • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
    • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
    • For dual mode testing, GSM speech loop back is supported forGSM bit error ratio (BER) measurements
  • All trademarks shown here are for reference purposesonly. They are the property of their respective owners, and we arenot authorized to sell items bearing such trademarks.
  • High performance IC
  • Used in smart card
  • Body material: ABS or PVC
  • CPU: 8 bits
  • 256 bytes inner RAM (256 x 8-bit SRAM)
  • 1KB outer RAM (1,024 x 8-bit SRAM)
  • 48KB program memorize (48KB x 8-bit ROM)
  • 32KB data memorize (32KB x 8-bit EEPROM)
  • 32KB EEPROM as data memorizer
  • Single byte read, write, and wipe
  • Multi-bytes storage (1 byte to 1 page)
  • Program clock come from vibrate clock that generated by chipitself
  • At the normal temperature, can precede at least 100,000-timeerase and write operating
  • EEPROM data endurance more than ten years
  • EEPROM program voltage generated in the chip
  • Asynchronous half-duplex transmission protocol
  • Two kinds of transmission velocity (372/1 and 512/8)(optional)
  • Randomizer: 8 bits
  • Power on reset: internal power on reset mechanism
  • Low-powered work mode: sleep and clock stop
  • Safety mechanism: abnormal voltage/frequency detectionfunction, DPA/SPS attacking immunity
  • Working temperature: -25 to +70 degrees Celsius
  • Working voltage: 2.7V to 3.3 and 4.5V to 5.5V
  • Working frequency: 1 to 5MHz (3.57MHz)
  • Can be used in the agilest 8960 and others to test set whenrunning any GSM test or lab application
  • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
  • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
  • For dual mode testing, GSM speech loop back is supported forGSM bit error ratio (BER) measurements
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