Green Card (Shenzhen) Co. Ltd
Green Card (Shenzhen) Co. Ltd
2.5G Test SIM Card with 8-bit CPU and High Performance IC, Made of ABS or PVC Body Material
  • 2.5G Test SIM Card with 8-bit CPU and High Performance IC, Made of ABS or PVC Body Material
  • 2.5G Test SIM Card with 8-bit CPU and High Performance IC, Made of ABS or PVC Body Material
2.5G Test SIM Card with 8-bit CPU and High Performance IC, Made of ABS or PVC Body Material
2.5G Test SIM Card with 8-bit CPU and High Performance IC, Made of ABS or PVC Body Material

2.5G Test SIM Card with 8-bit CPU and High Performance IC, Made of ABS or PVC Body Material

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Basic Info
Basic Info
Payment Type: Telegraphic Transfer in Advance (Advance TT, T/T)
Product Description
Product Description
  • Specifications:
    • High performance IC
    • Used in smart card
    • Body material: ABS or PVC
    • CPU: 8 bits
    • Memory (32KB):
      • 256 bytes inner RAM (256 x 8-bit SRAM)
      • 1KB outer RAM (1,024 x 8-bit SRAM)
      • 48KB program memory (48KB x 8-bit ROM)
      • 32KB data memory (32KB x 8-bit EEPROM)
    • EEPROM (32KB):
      • 32KB EEPROM as data memory
      • Single byte read, write and wipe
      • Multi-bytes storage (1 byte to 1 page)
      • Program clock come from vibrate clock that generated by chipitself
      • At the normal temperature, can precede at least 100,000 timeserase and write operating
      • EEPROM data endurance more than ten years
      • EEPROM program voltage generated in the chip
    • Serial I/O interface:
      • With IEC-7816 marks
      • Asynchronous half-duplex transmission protocol
      • Two kinds of transmission velocity (372/1 and 512/8)(optional)
    • Random: 8 bits
    • Power on reset: internal power on reset mechanism
    • Low power work mode: sleep and clock stop
    • Safety mechanism: abnormal voltage, frequency detectionfunction and DPA/SPS attacking immunity
    • Operating temperature: -25 to 70°C
    • Operating voltage: 2.7 to 3.3V and 4.5 to 5.5V
    • Operating frequency: 1 to 5MHz (3.57MHz)
    • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab application
  • Advantages:
    • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
    • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
    • For dual mode testing, GSM speech loop back is supported forGSM bit error ratio (BER) measurements
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  • High performance IC
  • Used in smart card
  • Body material: ABS or PVC
  • CPU: 8 bits
  • Memory (32KB):
    • 256 bytes inner RAM (256 x 8-bit SRAM)
    • 1KB outer RAM (1,024 x 8-bit SRAM)
    • 48KB program memory (48KB x 8-bit ROM)
    • 32KB data memory (32KB x 8-bit EEPROM)
  • EEPROM (32KB):
    • 32KB EEPROM as data memory
    • Single byte read, write and wipe
    • Multi-bytes storage (1 byte to 1 page)
    • Program clock come from vibrate clock that generated by chipitself
    • At the normal temperature, can precede at least 100,000 timeserase and write operating
    • EEPROM data endurance more than ten years
    • EEPROM program voltage generated in the chip
  • Serial I/O interface:
    • With IEC-7816 marks
    • Asynchronous half-duplex transmission protocol
    • Two kinds of transmission velocity (372/1 and 512/8)(optional)
  • Random: 8 bits
  • Power on reset: internal power on reset mechanism
  • Low power work mode: sleep and clock stop
  • Safety mechanism: abnormal voltage, frequency detectionfunction and DPA/SPS attacking immunity
  • Operating temperature: -25 to 70°C
  • Operating voltage: 2.7 to 3.3V and 4.5 to 5.5V
  • Operating frequency: 1 to 5MHz (3.57MHz)
  • Can be used in the Agilent 8960 and others to test set whenrunning any GSM test or lab application
  • 256 bytes inner RAM (256 x 8-bit SRAM)
  • 1KB outer RAM (1,024 x 8-bit SRAM)
  • 48KB program memory (48KB x 8-bit ROM)
  • 32KB data memory (32KB x 8-bit EEPROM)
  • 32KB EEPROM as data memory
  • Single byte read, write and wipe
  • Multi-bytes storage (1 byte to 1 page)
  • Program clock come from vibrate clock that generated by chipitself
  • At the normal temperature, can precede at least 100,000 timeserase and write operating
  • EEPROM data endurance more than ten years
  • EEPROM program voltage generated in the chip
  • With IEC-7816 marks
  • Asynchronous half-duplex transmission protocol
  • Two kinds of transmission velocity (372/1 and 512/8)(optional)
  • UMTS security variables within the SIM match the defaultsettings of the GSM test and lab applications
  • Set-up time is reduced because the SIM is configured with thesame default IMSI and PLMN values broadcast from the test set
  • For dual mode testing, GSM speech loop back is supported forGSM bit error ratio (BER) measurements
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